Power and noise as physical size limitations to microelectronic elements.

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dc.contributor.authorCaloia, V.
dc.date.accessioned2009-03-23T14:53:49Z
dc.date.available2009-03-23T14:53:49Z
dc.date.created1967
dc.date.issued1967
dc.degree.levelMasters
dc.degree.nameM.Sc.
dc.identifier.citationSource: Masters Abstracts International, Volume: 40-07, page: .
dc.identifier.urihttp://hdl.handle.net/10393/7432
dc.identifier.urihttp://dx.doi.org/10.20381/ruor-15328
dc.publisherUniversity of Ottawa (Canada)
dc.subject.classificationEngineering, General.
dc.titlePower and noise as physical size limitations to microelectronic elements.
dc.typeThesis

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