Topics in reliability of sequential circuits.
| dc.contributor.author | Chung, W. K. | |
| dc.date.accessioned | 2009-03-23T14:50:05Z | |
| dc.date.available | 2009-03-23T14:50:05Z | |
| dc.date.created | 1970 | |
| dc.date.issued | 1970 | |
| dc.degree.level | Masters | |
| dc.degree.name | ADV DEG | |
| dc.identifier.citation | Source: Dissertation Abstracts International, Volume: 62-13, Section: A. | |
| dc.identifier.uri | http://hdl.handle.net/10393/7146 | |
| dc.identifier.uri | http://dx.doi.org/10.20381/ruor-11635 | |
| dc.publisher | University of Ottawa (Canada) | |
| dc.subject.classification | Engineering, General. | |
| dc.title | Topics in reliability of sequential circuits. | |
| dc.type | Thesis |
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