Topics in reliability of sequential circuits.

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dc.contributor.authorChung, W. K.
dc.date.accessioned2009-03-23T14:50:05Z
dc.date.available2009-03-23T14:50:05Z
dc.date.created1970
dc.date.issued1970
dc.degree.levelMasters
dc.degree.nameADV DEG
dc.identifier.citationSource: Dissertation Abstracts International, Volume: 62-13, Section: A.
dc.identifier.urihttp://hdl.handle.net/10393/7146
dc.identifier.urihttp://dx.doi.org/10.20381/ruor-11635
dc.publisherUniversity of Ottawa (Canada)
dc.subject.classificationEngineering, General.
dc.titleTopics in reliability of sequential circuits.
dc.typeThesis

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