The application of Hall effect device for the measurement of low magnetic field.
| dc.contributor.author | Chaudhry, Nazir A. | |
| dc.date.accessioned | 2009-04-17T16:01:30Z | |
| dc.date.available | 2009-04-17T16:01:30Z | |
| dc.date.created | 1965 | |
| dc.date.issued | 1965 | |
| dc.degree.level | Masters | |
| dc.degree.name | M.Sc. | |
| dc.description.abstract | An indium antimonide Hall element is prepared, operated at liquid nitrogen temperature in combination with 5 inch long mumetal concentrator. The polycrystalline indium antimonide Hall probe provides an overall sensitivity of 12500 Volts/ampere-kilo gauss. The device is capable of measuring down to 2 x 10-5 gauss peak in the frequency range dc to 25 c/s. The factors which restrict the lowest limit of magnetic field detection are discussed and methods are suggested to further improve the sensitivity of the device. | |
| dc.format.extent | 78 p. | |
| dc.identifier.citation | Source: Masters Abstracts International, Volume: 45-06, page: 3236. | |
| dc.identifier.uri | http://hdl.handle.net/10393/10759 | |
| dc.identifier.uri | http://dx.doi.org/10.20381/ruor-16994 | |
| dc.publisher | University of Ottawa (Canada) | |
| dc.subject.classification | Engineering, Electronics and Electrical. | |
| dc.title | The application of Hall effect device for the measurement of low magnetic field. | |
| dc.type | Thesis |
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