Single crystal surface investigations using RHEED.

dc.contributor.advisor	Hird, B.,
dc.contributor.author	Bulicz, John.
dc.date.accessioned	2009-03-23T15:57:14Z
dc.date.available	2009-03-23T15:57:14Z
dc.date.created	1992
dc.date.issued	1992
dc.degree.level	Masters
dc.degree.name	M.Sc.
dc.description.abstract	A RHEED system was assembled and incorporated in the existing ultra-high-vacuum chamber. A system for the production and transport of low energy ions to the ultra-high-vacuum environment was maintained. Samples cut from wafers of Si(100) were investigated using electron diffraction as well as low energy ion scattering techniques. The surface composition, symmetry and orientation of these specimens could be determined. Attempts to adsorb hydrogen onto the Si(100) surface indicated that the procedure in use needs to be modified. An initial RHEED study of the Si(110) surface revealed a complex arrangement of atoms which does not correspond to the "16 x 2" structure reported for the clean surface.
dc.format.extent	88 p.
dc.identifier.citation	Source: Masters Abstracts International, Volume: 32-05, page: 1408.
dc.identifier.isbn	9780315858206
dc.identifier.uri	http://hdl.handle.net/10393/7501
dc.identifier.uri	http://dx.doi.org/10.20381/ruor-11799
dc.publisher	University of Ottawa (Canada)
dc.subject.classification	Physics, Condensed Matter.
dc.title	Single crystal surface investigations using RHEED.
dc.type	Thesis

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