Spectral domain analysis and application of reflection and refraction phenomena in two-dimensional dielectric periodic structures

dc.contributor.authorDe Leon Arizpe, Israel
dc.date.accessioned2013-11-07T18:12:09Z
dc.date.available2013-11-07T18:12:09Z
dc.date.created2005
dc.date.issued2005
dc.degree.levelMasters
dc.degree.nameM.A.Sc.
dc.description.abstractThis thesis is intended to contribute to an analytical understanding of refraction and reflection phenomena of monochromatic electromagnetic fields at the interface between homogeneous media and two-dimensional PhCs by studying the k-space (Fourier domain) representation of the refracted and reflected fields. The goal is to provide physical explanations of distortion effects experienced by the fields when interacting with the periodic medium, and to evaluate quantitatively such effects through the analysis of the fields' angular spectra. The motivation for this investigation is the interesting reflection and refraction phenomena observed when light propagates across the interfaces between homogeneous dielectric regions and photonic crystals (PhCs), which is a situation often found in integrated optical systems. Such reflective and refractive phenomena play an important role in the operation of such systems. (Abstract shortened by UMI.)
dc.format.extent122 p.
dc.identifier.citationSource: Masters Abstracts International, Volume: 44-04, page: 1923.
dc.identifier.urihttp://hdl.handle.net/10393/26885
dc.identifier.urihttp://dx.doi.org/10.20381/ruor-18426
dc.language.isoen
dc.publisherUniversity of Ottawa (Canada)
dc.subject.classificationEngineering, Electronics and Electrical.
dc.titleSpectral domain analysis and application of reflection and refraction phenomena in two-dimensional dielectric periodic structures
dc.typeThesis

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