Studies on a continuous Markov model for probabilistic fault analysis in VLSI sequential circuits using computer simulation.

Wong, Kam Lung.2009-03-202009-03-2019901990Source: Masters Abstracts International, Volume: 31-01, page: 0406.9780315679986http://hdl.handle.net/10393/5876http://dx.doi.org/10.20381/ruor-10975A continuous parameter Markov model is proposed in this thesis to detect permanent stuck-at faults in sequential circuits by random testing. Given a sequential circuits with certain stuck-at faults specified, the fault-free and the faulty state tables of the circuit can be readily derived. By simulation of these two state tables on a computer, the parameters of the desired Markov model can be obtained. For a specified confidence level, it is easy to derive the model parameters and to estimate the required testing time. A complete mathematical analysis of the model is given that provides some useful insights into the nature of faults in relation to random testing and the associated confidence level.118 p.Engineering, Electronics and Electrical.Studies on a continuous Markov model for probabilistic fault analysis in VLSI sequential circuits using computer simulation.Thesis